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n NanoDMA III-Dynamic Nanoindentation:
NanoDMA III is a powerful dynamic nanoindentation technique that provides continuous measurement of elastic-plastic and viscoelastic properties as a function of indentation depth, frequency, and time.
n XPM-Accelerated Property Mapping:
XPM sets a new industry standard for nanomechanical testing throughput paired with measurement resolution and accuracy. At up to 6 nanoindentation measurements/second, XPM delivers comprehensive nanomechanical property maps and property distribution statistics in a record amount of time.
n SPM Imaging:
Pioneering scanning nanoindenters utilize the same probe to both raster the sample surface for topography imaging and to conduct the nanomechanical test. In-situ SPM imaging maximizes test placement accuracy, provides immediate post-test observation of material deformation behavior, and accelerates testing throughput.
n Nanoindentation:
Precise lateral positioning and nanoscale load and depth control allow for the quantitative determination of localized mechanical properties such as elastic modulus, hardness, creep, stress relaxation, and fracture toughness for a wide variety of materials.
n Nanoscratch:
Ultra-sensitive force and displacement measurements in both the normal and lateral directions enable quantitative nanoscale tribological characterization on individual microstructures and interfaces, along with interfacial adhesion characterization of ultra-thin films.
n Nanowear:
Quantify wear behavior over the nanometer to micrometer length scales as a function of number of sliding cycles, sliding velocity, wear area, and applied force.
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